Profile

  • deposition of thin films by magnetron sputtering and vacuum evaporation
  • thin film plasmon resonance measurement
  • deposition of metal nanoparticles by high-pressure magnetron sputtering
  • thin film analysis by spectrophotometer and ellipsometry
  • excitation of photoluminescence by surface plasmon resonance

ORCID ID 0000-0001-5956-5100
ResearcherID AAQ-8129-2020
SCOPUS ID 57188996772