Ing. Emil Šípek, CSc.

Category

Professional staff member with higher education

Division (no.)

Division of Solid State Physics (3)

Department (no.)

Department of Thin Films and Nanostructures (26)

Laboratory / Scientific group

Nanoscale Materials and Systems (2613)

Telephone

+420 220 318 529, +420 220 318 569

E-mail

sipek [at] fzu.cz

Locality

Cukrovarnická

Room

A 7

C 213/6

E. Verveniotis, E. Šípek, J. Stuchlík, J. Kočka, B. Rezek
Generating ordered Si nanocrystals via atomic force microscopy
Journal of Non-Crystalline Solids 358 (2012) 2118-2121.
E. Verveniotis, B. Rezek, E. Šípek, J. Stuchlík, M. Ledinský, J. Kočka
Impact of AFM-induced nano-pits in a-Si:H films on silicon crystal growth
Nanoscale Research Letters 6 (2011) 145(1)-145(6).
E. Verveniotis, B. Rezek, E. Šípek, J. Stuchlík, J. Kočka
Role of current profiles and atomic force microscope tips on local lectric crystallization of amorphous silicon
Thin Solid Films 518 (2010) 5965-5970.
B. Rezek, E. Šípek, M. Ledinský, J. Stuchlík, A. Vetuško, J. Kočka
Creating nanocrystals in amorphous silicon using a conductive tip
Nanotechnology 20 (2009) 045302 (1)-045302 (6).
B. Rezek, E. Šípek, M. Ledinský, P. Krejza, J. Stuchlík, A. Fejfar, J. Kočka
Spatially localized current-induced crystallization of amorphous silicon films
Journal of Non-Crystalline Solids 354 (2008) 2305-2309.

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