Profile

Thin layers preparation  (Materials: Diamnond Like Carbon, Hydroxyapatite, Metals and others, Techniques: Pulsed Laser Deposition, Magnetron Sputtering, Radio-frequency discharge, MAPLE).
Thin layers characterization (Mechanical profilometry, Optical spectroscopies,
Mechanical properties – Adhesion, Coefficient of friction, Wear resistance).
Team member of projects - grants backed by GACR, TACR, COST, ...


ORCID 0000-0003-0098-9413
ResearcherID ADU-6918-2022
Scopus Author ID 55349185400
Researchgate