Laboratory of optical and photoelectrical spectroscopy (Z. Remeš, J. Holovský)

Experimental equipment:

  1. Aparatura CPM (constant photocurrent method) Měření spekter optické absorpce v amorfních, nanokrystalických a mikrokrystalických tenkých vrstvách polovodičů (a-Si, μc-Si pro sluneční články, ...)
  2. FTPS (Fourier transform photocurrent spectroscopy) apparatus.

Photocurrent spectra and optical absorption spectra in the spectral range UV-VIS-NIR, temperature range 77 – 400 K, together with a standard FTIR vibrational spectroscopy, ATR measurements, measurements with an integration sphere, ...

  • PDS (photothermal deflection spectroscopy) apparatus. Precise measurement of a small value of the optical absorption coefficient in thin layers, as amorphous or nanocrystalline Si, diamond or nanocrystalline diamond, transparent conductive oxides as ZnO, SnO2, solar absorber CuInGaSe, in a broad spectral range UV-VIS-NIR, together with measurement of transmittance and reflectance.
  • Laser calorimetry (excited at 532 nm, 635nm, 830nm a 1064 nm). Absolute measurement of the small values of absorptance.
  • Experimental study of light scattering at nano-rough and micro-rough surfaces. This is complemented with optical modeling of thin film silicon solar cells with nanorough surfaces and interfaces (Monte Carlo model CELL).
  • In general, we perform all optical and photoelectrical characterization of important materials for thin film photovoltaics, together with characterization of layers deposited in our Laboratory of Diamond thin films and carbon nanostructures