Focused ion beam (FIB) milling

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Focused ion beam technique was used to analyse a crater in alumina created by the repeated nanoindentation method at a high strain rate. The cross-sectional view revealed intergranular cracks beneath the surface which are not visible on the surface of the sample. Formation of cracks was detected during measurement using the high-frequency acoustic emission method and subsequently confirmed using the FIB method.

Focused ion beam (FIB) milling
Description
Figure: (a) A crater on the surface of an alumina sample created by repeated nanoindentation. Cross-sectional view of this crater fabricated by FIB milling (b) revealing intergranular cracks.

B. D. Beake, R. Čtvrtlík, A. J. Harris, A. S. Martin, L. Václavek, J. Maňák, V. Ranc. High frequency acoustic emission monitoring in nano-impact of alumina and partially stabilised zirconia. Materials Science and Engineering A 780 (2020).