CrysTBox twoBeamGUI - TEM sample thickness estimation

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CrysTBox twoBeamGUI

CrysTBox twoBeamGUI is an automated tool which estimates thickness of TEM sample using a convergent beam electron diffraction (CBED) in two-beam approximation.


Two methods of the sample thickness calculation are implemented in twoBeamGUI, both of which are based on analysis of intensity profile across the diffracted disk. One method relies on a linear regression of its local minima (Allen 1981), but is not recommended for inexperienced users. The default and recommended method is based on comparison of the experimental profile with set of theoretical profiles calculated for given thickness range according formula VII.12 in Mornirolli (2002).


Results of individual steps of the automated analysis.


What data does it need?

What results does it provide?

  • TEM sample thickness

Further information

Here you can find further materials about twoBeamGUI.

Quick-start video
Short video showing how to work with twoBeamGUI.
Step-by-step guide
Covers the whole analysis from opening the image to investigation of results.

More information about the theory can be found in

  • Morniroli, J. (2002). Large-Angle Convergent-Beam Electron Diffraction (LACBED): Applications to Crystal Defects. Paris: Societe Francaise des Microscopies.
  • Allen, S. M. (1981). Philos. Mag. A, 43, 325–335.


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