CrysTBox diffractGUI is computer tool for automated analysis electron diffraction patterns and HRTEM images. In 30 seconds, it identifies zone axis and measures d-spacings, interplanar angles etc.
Normally, this is done in one click. Since each step of the analysis can be adjusted or performed manually, even the most difficult images can be analyzed still saving you lot of time and effort.
What data does it need?
- sample material
- input image depicting
- HRTEM (high resolution TEM) image
- diffraction - spot diffraction, CBED, nanodiffraction
What results does it provide?
- identified zone axis and reflections
- measured interplanar angles and distances
- in combination with cellViewer, interactive equivalent of the input diffraction pattern and appropriately oriented atomic structure
- spoler: in the next version, new features will be available including
- direct overlay of simulated pattern on the experimental image
- full control of graphical visualization and export
If you are interested how diffractGUI copes with various input images, see examples.
From brief handshake to deep expertise
Here you can find further materials about diffractGUI from very basic to advanced ones.
- Quick-start video
- Short video showing how CrysTBox copes even with a noisy diffraction pattern.
- Step-by-step guide
- Covers the whole analysis from opening the image through all the steps of the automatic analysis, their partial results to the final results and their interpretation.
- Commented video tutorial
- Ancient video showing showing how to work with one of the first versions of diffractGUI, ringGUI and cellViewer. Even though many new features have been added, the principles and basic controls still remain the same.
- Detailed description of graphical user interface
- Ancient but very detailed description of user interface controls. Again, even though many new features have been added, the principles and basic controls still remain the same.