Bohuslav Rezek – REPRINTS

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Kelvin force microscopy on diamond surfaces and devices
Diam. Relat. Mater., Vol. 14 (2005) pp. 466-469	-

Hydrogenated diamond surfaces studied by atomic and Kelvin force microscopy
Diam. Relat. Mater., Vol. 13 (2004) pp. 740-745	pdf file

Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy
Appl. Phys. Lett., Vol. 83 (2003) pp. 1764-1766	pdf file

Scribing into hydrogenated diamond surfaces using atomic force microscopy
Appl. Phys. Lett., Vol. 82 (2003) pp. 3336-3338	pdf file

Fermi level on hydrogen terminated diamond surfaces
Appl. Phys. Lett., Vol. 82 (2003) pp. 2266-2268	pdf file

Local oxidation of hydrogenated diamond surfaces for device fabrication
phys. stat. sol. (a) 193 (2002) pp. 523-528	pdf file

Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
J. Appl. Phys., Vol.92 (2002) pp. 587-593	pdf file

Laser beam induced currents in polycrystalline silicon thin films prepared by interference laser crystallization
J. Appl. Phys., Vol.91 (2002) pp. 4220-4227	pdf file

Influence of Combined AFM/Current Measurement on Local Electronic Properties of Silicon Thin Films
J. Non-Crystal. Solids, Vol.299-302 (2002) pp. 360-363	pdf file

Local Photoconductivity Correlation with Granular Structure of Microcrystalline Silicon Thin Films
J. Non-Crystal. Solids, Vol.266-269 (2000) pp. 315-318	pdf file

Local Electronic Transport in Microcrystalline Silicon Observed by Combined AFM Measurements
J. Non-Crystal. Solids, Vol.266-269 (2000) pp. 309-314	pdf file

Interference Laser Crystallization of Microcrystalline Silicon Using Asymmetric Beam Intensities
J. Non-Crystal. Solids, Vol.266-269 (2000) pp. 650-653	pdf file

Correlation of Photoconductivity and Structure of Microcrystalline Silicon Thin Films with Submicron Resolution
Appl. Phys. Lett., Vol.75, No.12 (1999) pp. 1742-1744	pdf file

Polycrystalline Silicon Thin Films Produced by Interference Laser Crystallization of Amorphous Silicon
Jpn. J. Appl. Phys., Vol.38, No.10A (1999) pp. L1083-1084	pdf file

Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
Appl. Phys. Lett., Vol.74, No.10 (1999) pp. 1475-1477	pdf file

Characterization of Laser Patterned a-Si:H Thin Films by Combined AFM / Local Current
phys. stat. sol. (a) 170/1 (1998) R1	pdf file

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